Differential thermal analysis (DTA) involves heating and cooling a sample and an inert reference
under identical conditions, while recording any temperature difference between the sample and reference.
The temperature difference is plotted against time, or against temperature. Any changes in the sample accompanied
by heat absorption or evolution or by change in the specific heat can be detected relative to the inert reference.
DTA provides data on the melt and crystallization temperature, the temperature of peritectic reactions, structural
and magnetic phase transitions, which is important for the synthesis procedure and the following thermal treatment.
Investigation of the thermal behavior of many-component systems as a function of the system composition results in
T-x phase diagrams. The latter play a vital role for development of the optimal crystal growth technique.
Technical data of the device:
Operating temperature: from room temperature to 1750°C
Atmosphere: Argon or vacuum
Sample mass: 50 - 200 mg
Heating rate: from 0.1 to 100°C/min
