Last Update: 2006-02-16

PROFILOMETER

The Taylor Hobson Surtronic 3+ profilometer is an extremely versatile instrument. In the configuration displayed above it is equipped with a three axis sample stage which allows sample movement in three dimensions. Nonetheless, given the small dimensions of the instrument, surface profiles of basically arbitrarily shaped bodies can be assessed.
The resolution limit of the instrument is two nm vertical. Scans can be taken with lengths ranging from 1 mm to 4 cm. Surface profile scans can be quantified in respect to basic morphological parameters by a commercial software package.